Virtual IONTOF User School 2021
We are happy to announce that IONTOF will hold a User School in April and May 2021 for our TOF-SIMS instrument users. Due to the current pandemic restrictions, IONTOF has designed an online format to host the User School in 2021, allowing our users to attend the event safely. The event is designed to assure an interactive exchange between participants and application scientists using our GoToMeeting video conferencing tool. Due to the virtual setting of this year's IONTOF User School we have decided to offer several courses on different days that may be booked individually. Each course is designed to last approximately three hours to cover the respective content, as well as leaving time for individual questions and exchange.
The courses are dedicated to TOF-SIMS users and will cover all contents of the traditional IONTOF User School. This includes typical workflows in an analytical SIMS lab, ranging from sample preparation to the selection of appropriate measurement conditions and finally focusing on data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.2 software.
If you would like to attend the IONTOF User School Courses 2021 please use the registration form below.
The registration fee is 30 EUR per course.
Please note that all courses are limited to 40 attendees each, in order to assure an interactive setting for each session.

Places will be allocated on a “first come first served“ basis.
Online Courses
Data analysis with SurfaceLab 7 and beyond
20.04.2021 09:00-12:00 CEST
Concept of the data management in SurfaceLab 7.x in comparison to SL 6.x, major differences in the handling of software tools (corrections), presentation of all new features of 7.2, and a glimpse into the future of SurfaceLab.
Target group
Customers using SL7, customers interested in upgrading to SL7.
Sample Preparation – Navigation – Automation
21.04.2021 09:00-12:00 CEST
Tips and Tricks for sample preparation, using the sample holder and shi-files, topmount navigation, principle of automated measurements, recipe scheduler. Including live instrument demonstrations on an M6 instrument.
Target group
Beginners, using any IONTOF TOF-SIMS instrument.
Using MVSA features in SurfaceLab 7.2
22.04.2021 09:00-12:00 CEST
Using the tools for Multivariate Statistic Analysis in SurfaceLab 7.2, performing MVSA on spectra, profiles, images. Please note that we will not cover the math behind MVSA techniques.

Target group
Beginners and advanced users of TOF-SIMS IV,
TOF.SIMS 5 and M6 instruments.
Spectroscopy I
27.04.2021 09:00-12:00 CEST
Instrument setup and tuning – general guidelines: Analyser settings and tuning, LMIG settings and tuning, Bunching principle.

Spectra Program overview and data handling.
Target group
Beginners, users of TOF-SIMS IV, TOF.SIMS 5 or M6 instruments.
Spectroscopy II
28.04.2021 09:00-12:00 CEST
Start, setup of LMIG: beam alignment, current measurement, troubleshooting, advanced analyser settings, charge compensation, measurement parameters. Including live instrument demonstrations on an M6 instrument.

Target group
Beginners, users of an M6 instrument, attendance of Spectroscopy I is recommended.
Imaging I
04.05.2021 09:00-12:00 CEST
Selection of measurement conditions and tuning – general guidelines, delayed extraction principle, organic imaging. Image Program overview and data handling (cell operations, shift correction, advanced ToF correction, 3D operation,…).
Target group
Beginners, users of TOF-SIMS IV, TOF.SIMS 5 or M6 instruments.
Imaging II
05.05.2021 09:00-12:00 CEST
Setup of LMIG, beam alignment, focusing, setup of delayed extraction (Cu wire), stage scan Including live demonstrations on an M6 instrument.
Target group
Beginners, users of an M6 instrument, attendance of Imaging I is recommended.
Depth Profiling I
18.05.2021 09:00-12:00 CEST
Selection of measurement conditions, emphasis on inorganic profiling, depth resolution, sputter-rate-ratio, interlaced and non-interlaced mode, MCs mode, EDR principle. Profile Program overview and data handling.
Target group
Beginners and advanced users of TOF-SIMS IV,
TOF.SIMS 5 or M6 instruments.
Depth Profiling II
19.05.2021 09:00-12:00 CEST
Setup of DSC-S, beam alignment, focusing, depth profiling on insulators, extraction bias.

Including live demonstrations on an M6 instrument.
Target group
Beginners and advanced users of TOF-SIMS IV,
TOF.SIMS 5 and M6 instruments, attendance of Depth Profiling I recommended.
Organic depth profiling, GCIB operation
20.05.2021 09:00-12:00 CEST
Selection of measurement conditions, charge compensation, GCIB operation principle, settings and tuning, beam alignment, sputter conditions, GCIB analysis. Including live instrument demonstrations on an M6 instrument.
Target group
Beginners, users with a GCIB.
Registration
Please note
All courses for the Virtual User School 2021 are fully booked. Therefore, we are sorry to announce that the registration is closed.

For further information please contact
 sales@iontof.com.
FAQ
What pre-requisites are needed to attend the courses?
In the course we will repeat some ToF-SIMS operating basics and will also share some insights into special applications. However, it is highly recommended that you have a basic understanding of the SIMS principle and that you have operated a ToF-SIMS instrument before.
Will we be able to use the instrument?
We will not be able to grant access to a ToF-SIMS instrument. However, during the training routines for selecting appropriate measurement conditions and acquisition parameters to be used on a M6 instrument will be covered.
Which software version will be used?
The latest software version, SurfaceLab 7.2, will be used during the course. However, all users with older versions of SurfaceLab can participate with minor compromises.
Can I record the session?
No, it is not allowed to record the training session. However, all participants will receive extensive training materials in digital form.