The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. Ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research.
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High lateral resolution (< 50 nm) with the Nanoprobe 50
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Mass resolution > 30,000
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Unique delayed extraction mode for high transmission with high lateral and high mass resolution simultaneously
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Unmatched dynamic range and detection limits
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TOF MS/MS with CID fragmentation for molecular structure elucidation
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Flexible, push-button, closed-loop sample heating and cooling system for long-term operation without user interaction